Strip70nmDistance, one-dimensional layout, precision to ±0.25nm. Kä ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye. A wïc ba tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ Holographic Stripes ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k25kx-1000kx(Calibration de direction horizontale, ku calibration de instruments de nano-scale. A tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n
Silicone size:4×3×0.5mmSilicon dioxide manufacturing (spine width)35nm, dɔŋ35nmParameter kënë ka cïï kalibre).
Kä ye kek looi aye kä ye kek looi yiic:Model 70-1DkuModel 70-1DUTCYïn.Model 70-1DKalibration Sample,Tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n,A ka lëu bɛ̈n yök;Model 70-1DUTCKalibration Sample,Sertifikat,Lööŋ,Sertifikat (PTB, a German counterpart of NIST).

Lëk ë order:
|
Namba |
Nyuɔ̈ɔ̈r Produk |
Specifications |
|
80127-1D |
Model 70-1D, Calibration standard, Unmounted |
a |
|
80127-1D-X |
Aye dɛ̈t peei, a lëu bɛ̈n ya tääu në table de sample de pin nail; Wala kɛlAFMye (15mmStainless steeldisk); Wala specify sample table |
a |
|
80127-1DC |
Model 70-1DUTC, keke certificate,Yïn cï gɔ̈t |
a |
|
80127-1DC-X |
Aye dɛ̈t peei, a lëu bɛ̈n ya tääu në table de sample de pin nail; Wala kɛlAFMye (15mmStainless steeldisk); Wala specify sample table |
a |
