Measurement requirements
Ka tɛmɛ 3D ye fɛɛrɛ ye cɔl headphone dust film, ka tɛmɛ tɛmɛ ye cɔl dust film

Key Features Overview
1.Non-contact measurement, integrated design

2. 3D morphology scanning, multi-function data processing
3. A lëu bï ya tɛmɛ në kä juëc yiic

4.Easy luɔ̈ɔ̈i, looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi

5. Scanning speed, tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

6. ±0.5 to ±1μm repeat precision guarantee

7.Stability, anti-interference capability

Results measurement
Dɛɛr ye 7 μm ± 1 μm

Lɔ̈k kä ye kek yök në tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë

1. A wɛ̈t ye kɔɔr në kä ye kek them
2.Contact measurement, ye kë ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye
3. ye tɛ̈n tɔ̈u, tɛ̈n tɔ̈u, tɛ̈n tɔ̈u, tɛ̈n tɔ̈u
4.Measuring speed slow, precision low, measurement error large

5. Structure complex, wëu juëc