Measurement requirements
Kɔɔr kä ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi

Key Features Overview
1.Non-contact measurement, integrated design
2. 3D morphology scanning, multi-function data processing
3. A lëu bï ya tɛmɛ në kä juëc yiic
4.Easy luɔ̈ɔ̈i, looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi looi
5. Scanning speed, tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ
6. ±0.5 to ±1μm repeat precision guarantee

7.Stability, anti-interference capability

Results measurement
Ra ye 0.8μm ye

Lɔ̈k kä ye kek yök në tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë

1. A wɛ̈t ye kɔɔr në kä ye kek them
2.Contact measurement, ye kë ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye
3. ye tɛ̈n tɔ̈u, tɛ̈n tɔ̈u, tɛ̈n tɔ̈u, tɛ̈n tɔ̈u
4.Measuring speed slow, precision low, measurement error large

5. Structure complex, wëu juëc